Title of article
Achieving at-speed structural test
Author/Authors
S.، Pateras, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-25
From page
26
To page
0
Abstract
In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
Keywords
leukemia
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90294
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