Title of article :
Comparison of AES chemical shifts with XPS chemical shifts
Author/Authors :
Tetsu Sekine، نويسنده , , Nobuyuki Ikeo، نويسنده , , Yuji Nagasawa، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
6
From page :
30
To page :
35
Abstract :
Scanning Auger microprobe equipped with a concentric hemispherical analyzer allows us to measure AES spectra with high-energy resolution. The question is the extent of chemical state information obtainable by AES. XPS chemical shifts and AES chemical shifts, derived from transition energies available from literature, have been compared for many compounds. The mean values were found to be for peak shift 1.71 eV in the case of XPS and −3.86 eV for AES, and the standard deviations were 2.38 eV for XPS and 3.62 eV for AES. We found that the chemical shifts in AES were generally 1.5 times larger than in XPS. For some elements such as Fe, Co, Ni, and Cu, the AES chemical shifts are exceptionally small, but the peak shapes differ depending on the chemical states.
Journal title :
Applied Surface Science
Serial Year :
1996
Journal title :
Applied Surface Science
Record number :
990751
Link To Document :
بازگشت