Title of article
Bismuth-induced surface structure of Si 100/studied by scanning tunneling microscopy
Author/Authors
Masamichi Naitoh، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
38
To page
42
Abstract
We report results of a scanning tunneling microscopy investigation of the bismuth-induced structures at Si 100.surfaces.
Long linear chains of bismuth dimers are formed on the Si 100.surface after bismuth deposition at 4808C. This may be
self-organized by an enhanced migration of atoms along the chains. Moreover, bismuth atoms adsorbed on the surface
induce, by expelling silicon atoms from the substrate surface, a 2=n.restructuring with linear defects perpendicular to the
dimer rows on the Si terrace. q1999 Elsevier Science B.V. All rights reserved.
Keywords
Si 100.surface , Surface structure , Surface migration , STM , Bismuth
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995262
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