Title of article
Chemically diffuse interface in (1 1 1) Au–Ni multilayers: an anomalous X-ray diffraction analysis
Author/Authors
T. Bigault، نويسنده , , F. Bocquet، نويسنده , , S. Labat، نويسنده , , O. Thomas، نويسنده , , H. Renevier، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
110
To page
114
Abstract
This work elucidates the exact chemical nature of the interfaces in (1 1 1) Au–Ni multilayers grown by molecular beam epitaxy. We performed an X-ray investigation combining fitting of symmetric X-ray diffraction (XRD) spectra, and anomalous X-ray scattering analysis. We unambiguously show that the interfaces Au/Ni are abrupt, whereas the Ni/Au ones extend on five planes.
Keywords
Anomalous X-ray diffraction , Interfacial composition , Au–Ni multilayers
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997706
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