Title :
High-Frequency CMOS VLSI Chip Testability and On-Chip Interconnect Modeling
Author :
Ashok Srivastava استاد راهنما , Martin Feldman استاد مشاور , Jin-Woo Choi استاد مشاور
University :
Lovisiana State University
Major :
Master of Science in Electrical Engineering )M.S.E.E.( )Electrical Computer Engineering(
Keyword :
signal integrity , RLC Delay , Noise and Jitter , Time-Domain Reflectometry )TDR( , LABVIEW , Field Solvers , Differential Ring Oscillator
