شماره ركورد كنفرانس :
5060
عنوان مقاله :
Detection and Localization of Open-Circuit Fault in Modular Multilevel Converter
Author/Authors :
Mehdi، Khaleghi college of Electrical and Computer Engineering - University of Tehran Tehran, Iran , Hossein، Iman-Eini college of Electrical and Computer Engineering - University of Tehran Tehran, Iran , Shahrokh، Farhangi college of Electrical and Computer Engineering - University of Tehran Tehran, Iran , Saleh ، Farzamkia college of Electrical and Computer Engineering - University of Tehran Tehran, Iran
كليدواژه :
Fault-Detection , Fault-Diagnosis , Fault-Localization , Modular Multilevel Converter (MMC) , Open-Circuit Failure
عنوان كنفرانس :
11th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC)
چكيده فارسي :
فاقد چكيده فارسي
چكيده لاتين :
Reliability is one of the main concerns in utilizing modular multilevel converter (MMC) in medium/high-voltage applications because of having a large number of vulnerable components such as semiconductor devices and capacitors. The open-circuit fault of power switches is the most common type of faults in MMCs. This paper presents a fault detection and localization method for open-circuit faults of insulated gate bipolar transistors (IGBTs) in an MMC. The fault detection approach is simply implemented by checking the behavior of arm inductor current, and the fault localization method is based on the behavior of submodule(SM) capacitor voltage at various switching states and arm current directions. For implementation of the proposed method, neither additional voltage sensors nor additional current sensors are required. Therefore, this method does not increase the implementation cost of whole system. A simulation model has been implemented in MATLAB/Simulink environment to validate the effectiveness of the proposed method.
