Author/Authors :
ÇELİK, Erdal Dokuz Eylul University - Engineering Faculty, Center for Production and Applications of Electronic Materials (EMUM) - Department of Metallurgical and Materials Engineering, Turkey , BİRLİK, Işıl Dokuz Eylul University - Engineering Faculty - Department of Metallurgical and Materials Engineering, Turkey , HASCİCEK, Yusuf Suat Turksat A.S., Turkey , HASCİCEK, Yusuf Suat Akdeniz University - Science Faculty - Department of Space Science and Technologies, Turkey
Title Of Article :
Synthesis and Characterization of Pr2O3 Buffer Layers by Sol-Gel Process for YBCO Surface Coated Conductors
شماره ركورد :
27668
Abstract :
Pr2O3 films were deposited using a sol-gel process from solutions derived from praseodymium (III) isoproxide. Homogenous, crack-free, and dense films were deposited on Ni tapes between temperatures of 600°C and 850°C for YBCO surface coated conductors. These films were characterized by XRD, SEM and AFM. According to XRD pattern, Pr2O3 film is successfully grown on Ni substrate. It was found that microstructures of the films are dense, continuous, crack-free and pinhole-free. As a result, it is accepted that Pr2O3 film is suitable for YBCO surface coated conductors.
From Page :
103
NaturalLanguageKeyword :
YBCO , Sol , gel , and Buffer layers
JournalTitle :
Afyon Kocatepe University Journal Of Science an‎d Engineering
To Page :
105
Link To Document :
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