Title :
Single fault location in a linear analogue system with variable sensitivity matrix
Author_Institution :
Hong Kong Polytechnic, Department of Electronic Engineering, Kowloon, Hong Kong
Abstract :
A method of locating a single fault in a linear analogue system by determining the consistency of the inaccessible nodal voltage vectors is proposed. It does not require the assumption of an invariable sensitivity matrix, and can thus be applied to catastrophe faults as well.
Keywords :
electronic equipment testing; fault location; ATE; automatic test equipment; linear analogue system; single fault location; variable sensitivity matrix;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800158
