• DocumentCode
    1000197
  • Title

    A simple Flash memory cell model for transient circuit simulation

  • Author

    Kang, Yong Hoon ; Hong, Songcheol

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    26
  • Issue
    8
  • fYear
    2005
  • Firstpage
    563
  • Lastpage
    565
  • Abstract
    A simple Flash memory cell model for circuit simulation is presented. The proposed model gives an excellent fitting of dc and transient data and does not require additional simulation time comparing with that of a MOSFET transistor. Effective control-gate voltage method and ideal current-mirror technique are introduced to calculate floating-gate voltage. These allow macro modeling of a Flash memory cell in a circuit simulator.
  • Keywords
    circuit simulation; current mirrors; flash memories; integrated circuit modelling; integrated memory circuits; Flash memory cell model; control-gate voltage method; floating-gate voltage; ideal current-mirror technique; integrated circuit modeling; integrated memory circuits; macro modeling; transient circuit simulation; Capacitors; Character generation; Circuit simulation; Electrocardiography; Flash memory cells; MOSFET circuits; Nonvolatile memory; Parameter extraction; Threshold voltage; Voltage control; Erase; Flash EEPROM; Flash memory; Flash model; macro model; program;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2005.852525
  • Filename
    1468223