Title :
A summary of SEU test results using Californium-252
Author :
Harboe-Sorensen, R. ; Adams, L. ; Sanderson, T.K.
Author_Institution :
European Space Agency, Noordwijk, Netherlands
fDate :
12/1/1988 12:00:00 AM
Abstract :
The authors summarize four years of single-event-upset test results on a wide range of devices and technologies using Californium-252 having an average linear energy transfer of 43 MeV/(mg/cm2). Sensitivity variations are highlighted, particularly for nominally identical devices. The significance of the testing and test data with respect to recent devices and technologies is discussed
Keywords :
integrated circuit testing; radiation effects; semiconductor device testing; 252Cf; SEU test results; average linear energy transfer; nominally identical devices; single-event-upset test results; test data; Computer aided software engineering; Energy exchange; Immune system; Laboratories; Manufacturing; Performance evaluation; Single event upset; Software testing; Space technology; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
