Title :
Semiquantitative X-ray microanalysis on preforms for optical fibres
Author :
Hersener, J. ; Huber, H.-P. ; von Wienskowski, J.
Author_Institution :
AEG-Telefunken, Forschungsinstitut, Ulm, West Germany
Abstract :
The distribution of the GeO2-dopant in optical waveguides prepared by the VCVD process is determined with an SEM using energy dispersive microanalysis. A strong characteristic fluctuation of the GeO2-density within each freshly deposited layer is observed. This original GeO2-distribution is changed by interdiffusion and evaporation processes during the following steps of preform preparation and fibre drawing.
Keywords :
X-ray chemical analysis; germanium compounds; optical fibres; scanning electron microscope examination of materials; GeO2-density; GeO2-distribution; GeO2-dopant; SEM; VCVD process; X-ray microanalysis; characteristic fluctuation; energy dispersive microanalysis; evaporation processes; fabrication; fibre drawing; freshly deposited layer; interdiffusion; optical fibres; optical waveguides; preform preparation; preforms;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840138
