Abstract :
This newsletter covers news, research, and events related to the IEEE Council on Electronic Design Automation.
Keywords :
Circuit testing; Computer networks; Design automation; Design methodology; Electronic design automation and methodology; Electronic equipment testing; Electronics industry; Emulation; Multicore processing; Silicon; CANDE; CEDA; FCRP; GRC; Gary Smith; MEMOCODE; Phil Kaufman Award; Robert Brayton; TCAD;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.182
