• DocumentCode
    1001848
  • Title

    Phase Transformations During the Reaction Heat Treatment of Internal Tin Nb _{3} Sn Strands With High Sn Content

  • Author

    Scheuerlein, Christian ; Michiel, Marco Di ; Izquierdo, Gonzalo Arnau ; Buta, Florin

  • Author_Institution
    Eur. Organ. for Nucl. Res. (CERN), Geneva
  • Volume
    18
  • Issue
    4
  • fYear
    2008
  • Firstpage
    1754
  • Lastpage
    1760
  • Abstract
    The phase transformations that occur during the reaction heat treatment (HT) of Nb3Sn superconductors depend on the overall elemental composition of the strand subelements. In the case of modern high Jc strands with a relatively low Cu content, liquid phases are present during large temperature intervals and phases that can be detrimental for the microstructural and microchemical homogeneity of the fully reacted strand are formed. We report synchrotron X-ray diffraction measurements during in-situ reaction HT of a state-of-the-art high Jc Nb3 Sn internal tin strand. In this strand, Cu3Sn is formed upon Cu 6Sn 5 decomposition at 415degC, a Sn-rich ternary Cu-Nb-Sn phase is detected in the approximate temperature interval 345degC-575degC, and NbSn2 is present in the temperature interval 545degC-630degC. The formation of voids in the strand subelements has been monitored by synchrotron microtomography during in-situ reaction HT.
  • Keywords
    X-ray diffraction; copper alloys; critical current density (superconductivity); heat treatment; niobium alloys; phase transformations; pyrolysis; superconducting materials; tin alloys; Cu3Sn; Cu6Sn5; CuNbSn; Nb3Sn; NbSn2; decomposition; heat treatment; high Jc strands; in-situ reaction; liquid phases; microchemical homogeneity; microstructural homogeneity; phase transformations; superconductors; synchrotron X-ray diffraction; synchrotron microtomography; temperature 345 degC to 630 degC; Accelerator magnets; diffraction; superconducting filaments and wires; tomography;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2008.2006912
  • Filename
    4684292