DocumentCode
1001876
Title
SET/CMOS hybrid process and multiband filtering circuits
Author
Song, Ki-Whan ; Lee, Yong Kyu ; Sim, Jae Sung ; Jeoung, Hoon ; Lee, Jong Duk ; Park, Byung-Gook ; Jin, You Seung ; Kim, Young-Wug
Author_Institution
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume
52
Issue
8
fYear
2005
Firstpage
1845
Lastpage
1850
Abstract
We have developed an integration technology for the single electron transistor (SET)/CMOS hybrid systems. SET and CMOS transistors can be optimized without any possible degradation due to mixing dissimilar devices by adopting just one extra mask step for the separate gate oxidation (SGOX). We have confirmed that discrete devices show ideal characteristics required for the SET/CMOS hybrid systems. An SET shows obvious Coulomb oscillations with a 200-mV period and CMOS transistors show high voltage gain. Based on the hybrid process, new hybrid circuits, called periodic multiband filters, are proposed and successfully implemented. The new filter is designed to perform a filtering operation according to the periodic multiple blocking bands of which a period is originated from the SET. Such a novel function was implemented efficiently with a few transistors by making full use of the periodic nature of SET characteristics.
Keywords
CMOS integrated circuits; circuit oscillations; filters; oxidation; single electron transistors; Coulomb oscillations; MOSFET; SET/CMOS hybrid process; discrete devices; hybrid circuits; hybrid integrated circuits; integration technology; multiband filtering circuits; multivalued logic; periodic multiband filters; periodic multiple blocking bands; separate gate oxidation; single electron transistor; CMOS logic circuits; CMOS process; CMOS technology; Degradation; Filtering; Filters; Hybrid integrated circuits; MOSFET circuits; Single electron transistors; Voltage; Filters; MOSFET; hybrid integrated circuits; multivalued logic; single-electron transistor (SET);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2005.852730
Filename
1468377
Link To Document