• DocumentCode
    1003148
  • Title

    Reducing VBE wafer spread of bipolar transistor via a compensation circuit

  • Author

    Amador, R. ; Polanco, A. ; Hernandez, H. ; Gonzalez, E. ; Nagy, Akos

  • Author_Institution
    Inst. Superior Politecnico, Habana, Cuba
  • Volume
    28
  • Issue
    15
  • fYear
    1992
  • fDate
    7/16/1992 12:00:00 AM
  • Firstpage
    1378
  • Lastpage
    1379
  • Abstract
    A circuit which reduces the VBE wafer spread of a standard bipolar transistor in linear ICs is described. This compensation circuit takes advantage of the close correlation between Is and beta r. The spread of VBE is the major source of output error in IC temperature sensors with intrinsic reference, which thereby require resistive trimming.
  • Keywords
    Monte Carlo methods; bipolar integrated circuits; bipolar transistors; compensation; electric sensing devices; linear integrated circuits; temperature measurement; IC temperature sensors; Monte Carlo simulation; V BE wafer spread; bipolar transistor; compensation circuit; linear ICs; output error;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19920876
  • Filename
    256023
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1003148