DocumentCode
1004335
Title
The measurement of magneto-optic constants of thin transparent films
Author
Smith, A.B. ; Bekebrede, W.R. ; Kestigian, M.
Volume
20
Issue
5
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
1051
Lastpage
1053
Abstract
An ellipsometric technique for measuring the magneto-optic constants of ferro- and ferrimagnetic materials is described. The necessary apparatus is outlined, and the equations necessary for data reduction are given. Unlike previous work, these equations permit the measurement of thin transparent films. Typical results on magneto-optic garnets are presented.
Keywords
Magnetooptic materials/devices; Magnetooptic measurements; Amplifiers; Artificial intelligence; Computer aided instruction; Detectors; Equations; Light sources; Magnetooptic effects; Optical polarization; Peak to average power ratio; Silicon;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1984.1063310
Filename
1063310
Link To Document