DocumentCode
1004829
Title
Measurements of magnetic characteristics of thin film heads using magneto-optical method
Author
Narishige, S. ; Hanazono, M. ; Takagi, M. ; Kuwatsuka, S.
Author_Institution
Hitachi Research Lab., Hitachi City, Ibaraki, Japan
Volume
20
Issue
5
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
848
Lastpage
850
Abstract
Using a micro-Kerr magneto-optic apparatus, magnetization curves of thin film heads were measured. Relationships between repeatability of the magnetization process and readback wave form distortion were examined. In yokes made of positive magnetostriction NiFe the trianglar edge domains were found to be large, the magnetization process was not repeatable and readback wave form distortion was observed. For negative magnetostrictive yokes, the edge domains were smaller, the magnetization process was repeatable and wave form distortion was not observed.
Keywords
Magnetic recording/reading heads; Magnetooptic measurements; Distortion measurement; Magnetic domains; Magnetic films; Magnetic heads; Magnetic levitation; Magnetization processes; Magnetooptic effects; Magnetostriction; Sputtering; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1984.1063355
Filename
1063355
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