• DocumentCode
    1004829
  • Title

    Measurements of magnetic characteristics of thin film heads using magneto-optical method

  • Author

    Narishige, S. ; Hanazono, M. ; Takagi, M. ; Kuwatsuka, S.

  • Author_Institution
    Hitachi Research Lab., Hitachi City, Ibaraki, Japan
  • Volume
    20
  • Issue
    5
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    848
  • Lastpage
    850
  • Abstract
    Using a micro-Kerr magneto-optic apparatus, magnetization curves of thin film heads were measured. Relationships between repeatability of the magnetization process and readback wave form distortion were examined. In yokes made of positive magnetostriction NiFe the trianglar edge domains were found to be large, the magnetization process was not repeatable and readback wave form distortion was observed. For negative magnetostrictive yokes, the edge domains were smaller, the magnetization process was repeatable and wave form distortion was not observed.
  • Keywords
    Magnetic recording/reading heads; Magnetooptic measurements; Distortion measurement; Magnetic domains; Magnetic films; Magnetic heads; Magnetic levitation; Magnetization processes; Magnetooptic effects; Magnetostriction; Sputtering; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1984.1063355
  • Filename
    1063355