DocumentCode :
1009498
Title :
Shelf like of electronic/electrical devices
Author :
Polanco, S. ; Behera, A.K.
Author_Institution :
Commonwealth Edison Co., Downers Grove, IL, USA
Volume :
40
Issue :
4
fYear :
1993
fDate :
8/1/1993 12:00:00 AM
Firstpage :
809
Lastpage :
815
Abstract :
Inconsistencies among various industry practices regarding the determination of shelf life for electrical and electronic components are discussed. New methodologies developed to evaluate the shelf life of electrical and electronic components are described, and numerous tests are presented. Based upon testing and analysis using the Arrhenius methodology and typical materials used in the manufacturing of electrical and electronic components, the shelf life of these devices is determined to be indefinite. Various recommendations to achieve an indefinite shelf life are presented to ultimately reduce inventory and operating costs at nuclear power plants
Keywords :
ageing; electron device testing; electronic equipment testing; life testing; Arrhenius methodology; electrical devices; electronic components; indefinite shelf life; shelf life; tests; Assembly; Capacitors; Electrical equipment industry; Electronic components; Electronic equipment testing; Electronics industry; Life testing; Maintenance; Manufacturing industries; Power generation;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.256666
Filename :
256666
Link To Document :
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