• DocumentCode
    1010171
  • Title

    Influence of doping on threshold current of semiconductor lasers

  • Author

    Haug, A.

  • Author_Institution
    Max-Planck-Institut fÿr Festkörperforschung, Stuttgart, West Germany
  • Volume
    21
  • Issue
    18
  • fYear
    1985
  • Firstpage
    792
  • Lastpage
    794
  • Abstract
    Doping of the active layer of a semiconductor laser reduces the threshold carrier density, the more so the higher the doping level. As a consequence, the threshold current goes through a minimum dependent on doping. This minimum arises for doping densities of the order of 1018 cm¿3, and lies about 25% below the value without doping for an n-doped InGaAsP laser. As the temperature dependence of the threshold current is simultaneously weaker (T0¿85°), appropriate n-doping may improve the efficiency of a semiconductor laser. Additionally, it is shown that n-doping is more favourable than p-doping.
  • Keywords
    III-V semiconductors; carrier density; gallium arsenide; indium compounds; semiconductor doping; semiconductor junction lasers; III-V semiconductors; InGaAsP laser; active layer; doping; doping densities; semiconductor lasers; threshold carrier density; threshold current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850559
  • Filename
    4251358