DocumentCode
1010213
Title
Digital Circuit Design Challenges and Opportunities in the Era of Nanoscale CMOS
Author
Calhoun, By Benton H ; Cao, Yu ; Li, Xin ; Mai, Ken ; Pileggi, Lawrence T. ; Rutenbar, Rob A. ; Shepard, Kenneth L.
Author_Institution
Virginia Univ., Charlottesville
Volume
96
Issue
2
fYear
2008
Firstpage
343
Lastpage
365
Abstract
Well-designed circuits are one key ldquoinsulatingrdquo layer between the increasingly unruly behavior of scaled complementary metal-oxide-semiconductor devices and the systems we seek to construct from them. As we move forward into the nanoscale regime, circuit design is burdened to ldquohiderdquo more of the problems intrinsic to deeply scaled devices. How this is being accomplished is the subject of this paper. We discuss new techniques for logic circuits and interconnect, for memory, and for clock and power distribution. We survey work to build accurate simulation models for nanoscale devices. We discuss the unique problems posed by nanoscale lithography and the role of geometrically regular circuits as one promising solution. Finally, we look at recent computer-aided design efforts in modeling, analysis, and optimization for nanoscale designs with ever increasing amounts of statistical variation.
Keywords
CMOS logic circuits; circuit CAD; integrated circuit interconnections; nanoelectronics; nanolithography; clock distribution; computer-aided design; digital circuit design; geometrically regular circuits; logic circuit interconnects; memories; nanoscale CMOS; nanoscale lithography; power distribution; scaled complementary metal-oxide-semiconductor devices; simulation models; CMOS digital integrated circuits; Circuit synthesis; Clocks; Digital circuits; Integrated circuit interconnections; Logic circuits; MOS devices; Nanoscale devices; Power distribution; Power system interconnection; Clock distribution; complementary metal–oxide–semiconductor (CMOS); complementary metal–oxide–semiconductor (CMOS); device scaling; digital circuits; lithography; logic; manufacturability; memory; optimization; power distribution; regular circuit fabrics; statistical variability; yield;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2007.911072
Filename
4403891
Link To Document