Title :
On the complexity of single fault set diagnosability and diagnosis problems
Author :
Somani, Arun K. ; Agarwal, Vinod K. ; Avis, David
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
The complexity of the single-fault (SF) set diagnosability and SF-diagnosis problems under the symmetric invalidation models is discussed. It is shown that the SF-diagnosis problem under both these models is co-NP-complete and the SF-diagnosability problem is also co-NP-complete under the asymmetric invalidation model. The SF-diagnosability problem is also studied under the symmetric-invalidation model and a polynomial time-complexity algorithm is presented. These results are in contrast with the corresponding t-diagnosability and t-diagnosis problems, which are known to have polynomial time-complexity algorithms.<>
Keywords :
computational complexity; fault tolerant computing; complexity; diagnosis problems; polynomial time-complexity algorithm; single fault set diagnosability; symmetric invalidation models; t-diagnosability; Fault diagnosis; Polynomials;
Journal_Title :
Computers, IEEE Transactions on