DocumentCode :
1010788
Title :
A theory of voltage breakdown of cylindrical P-N junctions, with applications
Author :
Armstrong, Harold L.
Author_Institution :
Natl. Res. Council of Canada
Volume :
4
Issue :
1
fYear :
1957
Firstpage :
15
Lastpage :
16
Abstract :
In certain p-n junctions, such as those made by the alloy method, edges on the junction surface will, by field concentration, lead to lower inverse breakdown voltages than would otherwise be obtained. These edges are approximated by pieces of circular cylinders, and a formula for the voltage breakdown of a circular cylindrical junction obtained. The results agree qualitatively with those found for certain alloy-type diodes.
Keywords :
Breakdown voltage; Dielectric breakdown; Diodes; Electric breakdown; Electron devices; Electron mobility; Geometry; Helium; Lead; P-n junctions; Shape; Shape memory alloys;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1957.14194
Filename :
1472173
Link To Document :
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