DocumentCode
1012007
Title
A method of accurate thickness determination of germanium wafers suitable for transistor production
Author
Moore, A.R.
Author_Institution
RCA Laboratories, Princeton, N. J.
Volume
4
Issue
4
fYear
1957
Firstpage
309
Lastpage
310
Keywords
Brightness; Circuits; Collimators; Contracts; Electromagnetic wave absorption; Filters; Germanium; Iron; Production; Proposals; Radiation detectors; Scintillation counters; Solid scintillation detectors; Thickness measurement; Writing;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1957.14313
Filename
1472292
Link To Document