Title :
Optimization of thin film heads for resolution, peak shift and overwrite
Author :
Singh, Avtar ; Bischoff, Peter G.
Author_Institution :
Read-Rite Corporation, Milpitas, CA.
fDate :
9/1/1985 12:00:00 AM
Abstract :
Output response of thin film heads was analyzed using wavelength response to determine the optimum pole tip length for both low peak shift and high resolution. From the analytical analysis, thin film heads were designed and fabricated. The experimental results very much agree with the theoretical results. We conclude that by selecting the trailing pole to be thicker than the leading pole we can achieve optimum results for certain linear density requirements. We also observe that heads with thin poles provide better results at both low frequency and high frequency, while heads with thick poles work better at mid range frequency.
Keywords :
Magnetic films/devices; Magnetic recording/reading heads; Coercive force; Frequency; Magnetic analysis; Magnetic films; Magnetic heads; Magnetic hysteresis; Magnetic recording; Saturation magnetization; Sputtering; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1985.1063988