Title :
Optical low coherence reflectometry with range extension >150 m
Author :
Baney, D.M. ; Sorin, W.V.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fDate :
9/28/1995 12:00:00 AM
Abstract :
An extended range optical low coherence reflectometer using a resonant fibre cavity and a novel technique for alias identification has achieved a measurement range >150 m combined with a two-point spatial resolution of <200 μm
Keywords :
light coherence; optical fibres; optical resonators; reflectometry; 150 m; alias identification; extended range optical low coherence reflectometry; measurement range; resonant fibre cavity; two-point spatial resolution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19951222
