• DocumentCode
    1012811
  • Title

    70-MC silicon transistor

  • Author

    Brower, W.C. ; Earhart, C.E.

  • Author_Institution
    Texas Instruments, Inc., Dallas, Texas
  • Volume
    5
  • Issue
    2
  • fYear
    1958
  • fDate
    4/1/1958 12:00:00 AM
  • Firstpage
    117
  • Lastpage
    117
  • Keywords
    Circuit testing; Cutoff frequency; Fabrication; Gain measurement; Geometry; Germanium; Impurities; Performance gain; Power measurement; Production; Silicon; Switches; VHF circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1958.14393
  • Filename
    1472436