• DocumentCode
    10129
  • Title

    Automated Reduced Model Order Selection

  • Author

    Rewienski, Micha ; Fotyga, Grzegorz ; Lamecki, Adam ; Mrozowski, Micha

  • Author_Institution
    Dept. of Electron., Telecommun. & Inf., Gdansk Univ. of Technol., Gdańsk, Poland
  • Volume
    14
  • fYear
    2015
  • fDate
    2015
  • Firstpage
    382
  • Lastpage
    385
  • Abstract
    This letter proposes to automate generation of reduced-order models used for accelerated S-parameter computation by applying a posteriori model error estimators. So far, a posteriori error estimators were used in Reduced Basis Method (RBM) and Proper Orthogonal Decomposition (POD) to select frequency points at which basis vectors are generated. This letter shows how a posteriori error estimators can be applied to automatically select the order of the reduced model in second-order Model Order Reduction (MOR) methods. Three different error estimators are investigated and compared in order to arrive at a new MOR scheme that is fast, reliable, and fully automated. The effectiveness of the proposed approach is verified by very high accuracy of the computed scattering parameters ( S-parameters) for an example of a waveguide filter over a prescribed frequency band.
  • Keywords
    S-parameters; electromagnetic wave scattering; estimation theory; reduced order systems; POD; RBM; a posteriori model error estimators; accelerated S-parameter computation; automated reduced model order selection; frequency band; frequency point selection; proper orthogonal decomposition; reduced basis method; reduced-order model generation automation; scattering parameters; second-order model order reduction methods; waveguide filter; Computational modeling; Finite element analysis; Frequency estimation; Ports (Computers); Reduced order systems; Scattering parameters; Vectors; $S$-parameter computation; a posteriori error estimator; model order reduction;
  • fLanguage
    English
  • Journal_Title
    Antennas and Wireless Propagation Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1536-1225
  • Type

    jour

  • DOI
    10.1109/LAWP.2014.2364849
  • Filename
    6935071