• DocumentCode
    1012964
  • Title

    Screening by aging test for highly reliable laser diodes

  • Author

    Fujita, O. ; Nakano, Yoshiaki ; Iwane, G.

  • Author_Institution
    NTT Atsugi Electrical Communication Laboratories, Atsugi, Japan
  • Volume
    21
  • Issue
    24
  • fYear
    1985
  • Firstpage
    1172
  • Lastpage
    1173
  • Abstract
    The aging behaviour of laser diodes developed for undersea optical transmission systems is studied. Highly reliable laser diodes can be selected by a preliminary aging test (70°C, 5 mW, 1000 h).
  • Keywords
    ageing; optical communication equipment; optical testing; reliability; semiconductor junction lasers; aging behaviour; aging test; laser diodes; reliability; undersea optical transmission systems;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850829
  • Filename
    4251691
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1012964