DocumentCode
10134
Title
Multi-Wiener SURE-LET Deconvolution
Author
Feng Xue ; Luisier, Florian ; Blu, T.
Author_Institution
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Volume
22
Issue
5
fYear
2013
fDate
May-13
Firstpage
1954
Lastpage
1968
Abstract
In this paper, we propose a novel deconvolution algorithm based on the minimization of a regularized Stein´s unbiased risk estimate (SURE), which is a good estimate of the mean squared error. We linearly parametrize the deconvolution process by using multiple Wiener filters as elementary functions, followed by undecimated Haar-wavelet thresholding. Due to the quadratic nature of SURE and the linear parametrization, the deconvolution problem finally boils down to solving a linear system of equations, which is very fast and exact. The linear coefficients, i.e., the solution of the linear system of equations, constitute the best approximation of the optimal processing on the Wiener-Haar-threshold basis that we consider. In addition, the proposed multi-Wiener SURE-LET approach is applicable for both periodic and symmetric boundary conditions, and can thus be used in various practical scenarios. The very competitive (both in computation time and quality) results show that the proposed algorithm, which can be interpreted as a kind of nonlinear Wiener processing, can be used as a basic tool for building more sophisticated deconvolution algorithms.
Keywords
Haar transforms; Wiener filters; deconvolution; image processing; mean square error methods; minimisation; stochastic processes; wavelet transforms; elementary functions; equation linear system; linear coefficients; linear parametrization; mean squared error; multiWiener SURE-LET deconvolution; optimal processing; periodic boundary conditions; regularized Stein unbiased risk estimate; sophisticated deconvolution algorithms; symmetric boundary conditions; undecimated Haar-wavelet thresholding; Approximation methods; Deconvolution; Gaussian noise; Minimization; Noise reduction; Transforms; Vectors; Deconvolution; multi-Wiener filtering; stein´s unbiased risk estimate (SURE) minimization; undecimated Haar-wavelet thresholding;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2013.2240004
Filename
6410423
Link To Document