• DocumentCode
    1014081
  • Title

    Bayes attribute acceptance-sampling plan

  • Author

    Sheng, Zhou ; Fan, Da-Yin

  • Author_Institution
    Dept. of Appl. Math., Zhejiang Univ., Hangzhou, China
  • Volume
    41
  • Issue
    2
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    307
  • Lastpage
    309
  • Abstract
    The authors briefly review an approach for choosing a prior distribution for a Bayes attribute (good/bad) acceptance-sampling plan. A prior is chosen from confidence levels corresponding to classical lower confidence bounds. Where a Bayes plan is acceptable, the sample size can be reduced
  • Keywords
    Bayes methods; reliability; statistical analysis; Bayes plan; attribute acceptance-sampling plan; lower confidence bounds; prior distribution; reliability; Life testing; Probability; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.257799
  • Filename
    257799