DocumentCode
1014081
Title
Bayes attribute acceptance-sampling plan
Author
Sheng, Zhou ; Fan, Da-Yin
Author_Institution
Dept. of Appl. Math., Zhejiang Univ., Hangzhou, China
Volume
41
Issue
2
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
307
Lastpage
309
Abstract
The authors briefly review an approach for choosing a prior distribution for a Bayes attribute (good/bad) acceptance-sampling plan. A prior is chosen from confidence levels corresponding to classical lower confidence bounds. Where a Bayes plan is acceptable, the sample size can be reduced
Keywords
Bayes methods; reliability; statistical analysis; Bayes plan; attribute acceptance-sampling plan; lower confidence bounds; prior distribution; reliability; Life testing; Probability; Sampling methods;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.257799
Filename
257799
Link To Document