Title :
Bayes attribute acceptance-sampling plan
Author :
Sheng, Zhou ; Fan, Da-Yin
Author_Institution :
Dept. of Appl. Math., Zhejiang Univ., Hangzhou, China
fDate :
6/1/1992 12:00:00 AM
Abstract :
The authors briefly review an approach for choosing a prior distribution for a Bayes attribute (good/bad) acceptance-sampling plan. A prior is chosen from confidence levels corresponding to classical lower confidence bounds. Where a Bayes plan is acceptable, the sample size can be reduced
Keywords :
Bayes methods; reliability; statistical analysis; Bayes plan; attribute acceptance-sampling plan; lower confidence bounds; prior distribution; reliability; Life testing; Probability; Sampling methods;
Journal_Title :
Reliability, IEEE Transactions on
