• DocumentCode
    1015014
  • Title

    Performance of the 3-D PENCIL flash EPROM cell and memory array

  • Author

    Pein, Howard ; Plummer, James D.

  • Author_Institution
    Philips Lab., Briarcliff Manor, NY, USA
  • Volume
    42
  • Issue
    11
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    1982
  • Lastpage
    1991
  • Abstract
    A promising new 3-D Programmable Erasable Nonvolatile CylIndricaL (PENCIL) flash EPROM cell that offers significant area and performance advantages over conventional planar approaches has been implemented in a novel memory array. The 3-D PENCIL cell is a vertical device formed on the sidewalls of an etched silicon pillar. The cell is a single transistor stacked gate structure with the floating gate and control gate completely surrounding the pillar. Current flows vertically from the bit line contact at the top of the pillar to the source lying at the bottom of the pillar. When implemented in a novel self-aligned array, the cell size approaches the square of the minimum pitch and has an area less than half that of the conventional NOR type structure. The cell and array architecture also promise to be highly scalable. Experimental data reveals that the cells have up to 3× larger read current than comparable planar cells, are suitable for 5 V only operation and have fast program and erase speeds at moderate voltage levels. Uniformity and endurance characteristics are also promising
  • Keywords
    EPROM; isolation technology; memory architecture; 3D PENCIL flash EPROM cell; 5 V; LOCOS isolation; endurance characteristics; erase speed; etched Si pillar sidewalls; memory array; program speed; programmable erasable nonvolatile cylindrical flash EPROM cell; read current; scalable architecture; self-aligned array; single transistor stacked gate structure; uniformity characteristics; vertical device; Circuits; Costs; Doping profiles; EPROM; Etching; Laboratories; Nonvolatile memory; Silicon; Topology; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.469407
  • Filename
    469407