Title :
An analysis of switching effects in high-power diffused-base silicon transistors
Author_Institution :
Hughes Products, Los Angeles, Calif.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Bandwidth; Circuit noise; Coupling circuits; Frequency; Germanium; Life testing; Noise figure; Noise measurement; Power amplifiers; Silicon; Stability; Switches; Switching circuits; Telephony; Waveguide discontinuities;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1960.14657
