DocumentCode :
1015654
Title :
Simulation of cold-test parameters and RF output power for a coupled-cavity traveling-wave tube
Author :
Wilson, Jeffrey D. ; Kory, Carol L.
Author_Institution :
NASA Lewis Res. Center, Cleveland, OH, USA
Volume :
42
Issue :
11
fYear :
1995
fDate :
11/1/1995 12:00:00 AM
Firstpage :
2015
Lastpage :
2020
Abstract :
Procedures have been developed which enable the accurate computation of the cold-test (absence of an electron beam) parameters and RF output power for the slow-wave circuits of coupled-cavity traveling-wave tubes (TWT´s). The cold-test parameters, which consist of RF phase shift per cavity, impedance, and attenuation, are computed with the three-dimensional electromagnetic simulation code MAFIA and compared to experimental data for an existing V-band (59-64 GHz) coupled-cavity TWT. When simulated in cylindrical coordinates, the absolute average differences from experiment are only 0.3% for phase shift and 2.4% for impedance. Using the cold-test parameters calculated with MAFIA as input, the NASA Coupled-Cavity TWT Code is used to simulate the saturated RF output power of the TWT across the V-band frequency range. Taking into account the output window and coupler loss, the agreement with experiment is very good from 60-64 GHz, with the average absolute percentage difference between simulated and measured power only 3.8%. This demonstrates that the saturated RF output power of a coupled cavity TWT can be accurately simulated using cold-test parameters determined with a three dimensional electromagnetic simulation code
Keywords :
simulation; slow wave structures; travelling wave tubes; 59 to 64 GHz; MAFIA code; NASA code; RF output power; V-band; attenuation; cold-test parameters; coupled-cavity traveling-wave tube; impedance; phase shift; simulation; slow-wave circuits; three-dimensional electromagnetic simulation; Circuit simulation; Computational modeling; Coupling circuits; Electromagnetic coupling; Electron beams; Electron tubes; Impedance; Optical coupling; Power generation; Radio frequency;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.469412
Filename :
469412
Link To Document :
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