DocumentCode :
1015722
Title :
Avalanche breakdown voltages of diffused silicon and germanium diodes
Author :
Root, C.D. ; Lieb, D.P. ; Jackson, B.
Author_Institution :
Raytheon Manufacturing Co., Newton, Mass.
Volume :
7
Issue :
4
fYear :
1960
Firstpage :
257
Lastpage :
262
Abstract :
Avalanche breakdown is defined in terms of the diode´s electrical characteristics as well as the internal physical processes. Using the latter definition, and the basic diffusion equation, breakdown voltage is rigorously computed for various diffused junctions. The calculation process is described and similarities to both linear and abrupt junctions are pointed out. Graphs are presented showing breakdown voltage as a function of diffusion parameters for both germanium and silicon. Intermediate charts used in the calculations are shown also. These give maximum electric field in junction and normalized breakdown voltage for families of diffusions.
Keywords :
Avalanche breakdown; Breakdown voltage; Charge carrier processes; Diodes; Electric breakdown; Equations; Germanium; Ionization; P-n junctions; Semiconductor diodes; Silicon; Space charge;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1960.14690
Filename :
1472796
Link To Document :
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