DocumentCode
1016116
Title
Reset Operation of Quantum-Well Infrared Phototransistors
Author
An, Zhenghua ; Ueda, Toshitsugu ; Hirakawa, Kazuhiko ; Komiyama, Susumu
Author_Institution
Univ. of Tokyo, Tokyo
Volume
54
Issue
7
fYear
2007
fDate
7/1/2007 12:00:00 AM
Firstpage
1776
Lastpage
1780
Abstract
An improved operation of charge-sensitive infrared (IR) phototransistor (CSIP) is demonstrated by adding a reset function. The phototransistor is fabricated in a GaAs/AlGaAs double quantum-well (QW) structure. The upper QW is lithographically defined to form an isolated island. Under IR illumination (lambda ~ 14 mum), excited electrons escape from the isolated QW island. The QW island is thereby positively charged up, which, in turn, causes the conductance through the lower QW to increase. The performance of the detector, however, was restricted by the reduction of sensitivity, which arises from a distortion in the electrostatic potential profile caused by the accumulation of positive charges on the upper QW island. This drawback is removed by introducing a front gate on a channel leading to the isolated QW island. Applying positive pulses (duration 1 mus) to the gate, neutralizes the isolated QW island and reset the CSIP to the highly sensitive state. Typically, a current responsivity on the order of ~104 A/W is realized along with a dynamical range as large as > 109.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; infrared detectors; phototransistors; quantum well devices; GaAs-AlGaAs - Interface; charge-sensitive infrared phototransistor; current responsivity; double quantum-well structure; electrostatic potential profile; infrared detectors; isolated QW island; positive charge accumulation; quantum well devices; quantum-well infrared phototransistors; reset operation; Charge carrier processes; Electrons; Electrostatics; Gallium arsenide; Isolation technology; Optical imaging; Photodetectors; Phototransistors; Quantum well devices; Quantum wells; Infrared (IR) detectors; phototransistors; quantum-well (QW) devices;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.898675
Filename
4252353
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