Title :
Electron emission from p-n junctions
Author :
Moll, J.L. ; Meyer, N.I. ; Bartelink, D.J.
Author_Institution :
Stanford University, Stanford, Calif.
Keywords :
Charge carrier processes; Current measurement; Electron emission; Gallium arsenide; Gold; Grain boundaries; Insulation; P-n junctions; Photonic crystals; Semiconductor diodes; Silicon; Spontaneous emission; Surface treatment; Temperature; Thickness measurement; Tunneling;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1961.14823
