Title :
Accelerated aging of multiple diodes in a single encapsulation
Author :
Howard, B.T. ; Hare, W.F.J.
Author_Institution :
Bell Telephone Labs. Inc., Murray Hill, N.J.
Keywords :
Accelerated aging; Batch production systems; Charge carrier processes; Circuits; Costs; Diodes; Electrodes; Electron emission; Encapsulation; Insulation; Integrated circuit interconnections; Packaging; Radiative recombination; Semiconductor diodes; Spontaneous emission; Standardization;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1961.14824
