• DocumentCode
    1017601
  • Title

    Augmented reality user interface for an atomic force microscope-based nanorobotic system

  • Author

    Vogl, Wolfgang ; Ma, Bernice Kai-Lam ; Sitti, Metin

  • Author_Institution
    IWB Inst. for Machine Tools & Ind. Manage., Tech. Univ. Munich
  • Volume
    5
  • Issue
    4
  • fYear
    2006
  • fDate
    7/1/2006 12:00:00 AM
  • Firstpage
    397
  • Lastpage
    406
  • Abstract
    A real-time augmented reality (AR) user interface for nanoscale interaction and manipulation applications using an atomic force microscope (AFM) is presented. Nanoscale three-dimensional (3-D) topography and force information sensed by an AFM probe are fed back to a user through a simulated AR system. The sample surface is modeled with a B-spline-based geometry model, upon which a collision detection algorithm determines whether and how the spherical AFM tip penetrates the surface. Based on these results, the induced surface deformations are simulated using continuum micro/nanoforce and Maugis-Dugdale elastic contact mechanics models, and 3-D decoupled force feedback information is obtained in real time. The simulated information is then blended in real time with the force measurements of the AFM in an AR human machine interface, comprising a computer graphics environment and a haptic interface. Accuracy, usability, and reliability of the proposed AR user interface is tested by experiments for three tasks: positioning the AFM probe tip close to a surface, just in contact with a surface, or below a surface by elastically indenting. Results of these tests showed the performance of the proposed user interface. This user interface would be critical for many nanorobotic applications in biotechnology, nanodevice prototyping, and nanotechnology education
  • Keywords
    atomic force microscopy; augmented reality; nanotechnology; telerobotics; user interfaces; AFM probe; AR human machine interface; Maugis-Dugdale elastic contact mechanics models; atomic force microscope; augmented reality; biotechnology; nanodevice prototyping; nanomanipulation; nanorobotic system; nanoscale 3D topography; nanotechnology; surface deformations; telenanorobotics; user interface; Atomic force microscopy; Augmented reality; Computational modeling; Deformable models; Geometry; Probes; Solid modeling; Surface topography; Testing; User interfaces; Atomic force microscopy (AFM); augmented reality (AR) user interfaces; nanomanipulation; telenanorobotics;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2006.877421
  • Filename
    1652858