DocumentCode
1017601
Title
Augmented reality user interface for an atomic force microscope-based nanorobotic system
Author
Vogl, Wolfgang ; Ma, Bernice Kai-Lam ; Sitti, Metin
Author_Institution
IWB Inst. for Machine Tools & Ind. Manage., Tech. Univ. Munich
Volume
5
Issue
4
fYear
2006
fDate
7/1/2006 12:00:00 AM
Firstpage
397
Lastpage
406
Abstract
A real-time augmented reality (AR) user interface for nanoscale interaction and manipulation applications using an atomic force microscope (AFM) is presented. Nanoscale three-dimensional (3-D) topography and force information sensed by an AFM probe are fed back to a user through a simulated AR system. The sample surface is modeled with a B-spline-based geometry model, upon which a collision detection algorithm determines whether and how the spherical AFM tip penetrates the surface. Based on these results, the induced surface deformations are simulated using continuum micro/nanoforce and Maugis-Dugdale elastic contact mechanics models, and 3-D decoupled force feedback information is obtained in real time. The simulated information is then blended in real time with the force measurements of the AFM in an AR human machine interface, comprising a computer graphics environment and a haptic interface. Accuracy, usability, and reliability of the proposed AR user interface is tested by experiments for three tasks: positioning the AFM probe tip close to a surface, just in contact with a surface, or below a surface by elastically indenting. Results of these tests showed the performance of the proposed user interface. This user interface would be critical for many nanorobotic applications in biotechnology, nanodevice prototyping, and nanotechnology education
Keywords
atomic force microscopy; augmented reality; nanotechnology; telerobotics; user interfaces; AFM probe; AR human machine interface; Maugis-Dugdale elastic contact mechanics models; atomic force microscope; augmented reality; biotechnology; nanodevice prototyping; nanomanipulation; nanorobotic system; nanoscale 3D topography; nanotechnology; surface deformations; telenanorobotics; user interface; Atomic force microscopy; Augmented reality; Computational modeling; Deformable models; Geometry; Probes; Solid modeling; Surface topography; Testing; User interfaces; Atomic force microscopy (AFM); augmented reality (AR) user interfaces; nanomanipulation; telenanorobotics;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2006.877421
Filename
1652858
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