• DocumentCode
    1017760
  • Title

    1/f phase noise in quartz s.a.w. devices

  • Author

    Parker, T.E.

  • Author_Institution
    Raytheon Research Division, Waltham, USA
  • Volume
    15
  • Issue
    10
  • fYear
    1979
  • Firstpage
    296
  • Lastpage
    296
  • Abstract
    It has been observed that s.a.w. delay lines made on ST-cut quartz are the major source of 1/f noise in s.a.w. controlled oscillators. However, with proper treatment of the quartz surface, the 1/f noise can be significantly reduced. A modified expression for calculating the single-sideband f.m. noise power spectrum of s.a.w. oscillators is presented.
  • Keywords
    electron device noise; oscillators; quartz; random noise; surface acoustic wave devices; ultrasonic delay lines; 1/f phase noise; SAW controlled oscillators; SAW delay lines; SSB FM noise power spectrum; ST-cut quartz; quartz SAW devices; surface treatment;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790211
  • Filename
    4256021
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1017760