• DocumentCode
    1018136
  • Title

    Rough surface wavelength measurement through self mixing of Doppler microwave backscatter

  • Author

    Weissman, David E. ; Johnson, James W.

  • Author_Institution
    Hofstra Univ., Hempstead, NY, USA
  • Volume
    27
  • Issue
    6
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    730
  • Lastpage
    737
  • Abstract
    A microwave backscatter technique is presented that has the ability to sense the dominant surface wavelength of a random rough surface. The purpose of this technique is to perform this measurement from an aircraft or spacecraft, wherein the horizontal velocity of the radar is an important parameter of the measurement system. Attention will be directed at water surface conditions for which a dominant wavelength can be defined, then the spatial variations of reflectivity will have a two dimensional spectrum that is sufficiently close to that of waves to be useful. The measurement concept is based on the relative motion between the water waves and a nadir looking radar, and the fact that while the instantaneous Doppler frequency at the receiver returned by any elementary group of scatterers on a water wave is monotonically changing, the difference in the Doppler frequency between any two scattering "patches" stays approximately constant as these waves travel parallel to the major axis of an elliptical antenna footprint. The results of a theoretical analysis and a laboratory experiment with a continuous wave (CW) radar that encompasses several of the largest waves in the illuminated area show how the structure in the Doppler spectrum of the backscattered signal is related to the surface spectrum and its parameters in an especially direct and simple way when an incoherent envelope detector is the receiver.
  • Keywords
    Electromagnetic (EM) scattering by rough surfaces; Radar imaging/mapping; Sea surface electromagnetic scattering; Backscatter; Doppler radar; Frequency; Radar measurements; Radar scattering; Rough surfaces; Surface roughness; Surface waves; Velocity measurement; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1979.1142179
  • Filename
    1142179