• DocumentCode
    1018525
  • Title

    Ray interpretation of the material signature in the acoustic microscope

  • Author

    Parmon, W. ; Bertoni, Henry L.

  • Author_Institution
    Polytechnic Institute of New York, Brooklyn, USA
  • Volume
    15
  • Issue
    21
  • fYear
    1979
  • Firstpage
    684
  • Lastpage
    686
  • Abstract
    The output voltage of the reflection acoustic microscope depends on the location on the object surface in a way that is characteristic of its elastic properties. We present a ray model showing that this dependence is due to interference between a narrow bundle of axial rays and rays associated with the leaky Rayleigh wave excited on the surface.
  • Keywords
    Rayleigh waves; acoustic microscopes; axial rays; characteristic; elastic properties; interference; leaky Rayleigh wave; material signature; output voltage; ray interpretation; ray model; reflection acoustic microscope;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790486
  • Filename
    4256104
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1018525