• DocumentCode
    1018553
  • Title

    FCBM-a field-induced charged-board model for electrostatic discharges

  • Author

    Jin, D.L.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • Firstpage
    1047
  • Lastpage
    1052
  • Abstract
    This work addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharges (ESD). It describes a field-induced charged board model (FCBM) for the simulation of real world ESD. An experiment is designed to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental processes of the ESD phenomenon. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards for electronic subassemblies
  • Keywords
    electrostatic discharge; printed circuit testing; ESD current waveforms; ESD test standards; electronic subassemblies; electrostatic discharges; field-induced charged-board model; Biological system modeling; Circuit testing; Contacts; Electronic equipment testing; Electrostatic discharge; Humans; Integrated circuit packaging; Integrated circuit reliability; Pins; Wiring;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.259711
  • Filename
    259711