DocumentCode :
1019256
Title :
A 7-ns 140-mW 1-Mb CMOS SRAM with current sense amplifier
Author :
Sasaki, Katsuro ; Ishibashi, Koichiro ; Ueda, Kiyotsugu ; Komiyaji, Kunihiro ; Yamanaka, Toshiaki ; Hashimoto, Naotaka ; Toyoshima, Hiroshi ; Kojima, Fumio ; Shimizu, Akihiro
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
27
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
1511
Lastpage :
1518
Abstract :
A 7-ns 140-mW 1-Mb CMOS SRAM was developed to provide fast access and low power dissipation by using high-speed circuits for a 3-V power supply: a current-sense amplifier and pre-output buffer. The current-sense amplifier shows three times the gain of a conventional voltage-sense amplifier and saves 60% of power dissipation while maintaining a very short sensing delay. The pre-output buffer reduces output delays by 0.5 ns to 0.75 ns. The 6.6-μm2 high-density memory cell uses a parallel transistor layout and phase-shifting photolithography. The critical charge that brings about soft error in a memory cell can be drastically increased by adjusting the resistances of poly-PMOS gate electrodes. This can be done without increasing process complexity or memory cell area. The 1-Mb SRAM was fabricated using 0.3-μm CMOS quadrupole-poly and double-metal technology. The chip measures 3.96 mm×7.4 mm (29 mm2)
Keywords :
CMOS integrated circuits; SRAM chips; 0.3 micron; 1 Mbit; 140 mW; 3 V; 7 ns; CMOS SRAM; current sense amplifier; double-metal technology; high-density memory cell; high-speed circuits; low power dissipation; parallel transistor layout; phase-shifting photolithography; poly-PMOS gate electrodes; pre-output buffer; quadrupole-poly; static RAM; Circuits; Current supplies; Delay; High power amplifiers; Lithography; Power amplifiers; Power dissipation; Power supplies; Random access memory; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.165330
Filename :
165330
Link To Document :
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