Title :
Theory of noise in field effect transistors
Author :
van der Ziel, A.
Author_Institution :
University of Minnesota, Minneapolis, Minn.
Keywords :
1f noise; Circuit noise; FETs; Flexible printed circuits; Fluctuations; Frequency; Hot carriers; Laboratories; Low-frequency noise; Noise generators; Noise level; Noise reduction; Semiconductor device noise; Signal to noise ratio; Surface fitting; Transconductance; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15051
