Title :
Reply: Intrinsic lineshape and FM response of modulated semiconductor lasers
Author :
Eichen, E. ; Melman, Paul ; Nelson, W.H.
Author_Institution :
GTE Laboratories Inc., Waltham, USA
Keywords :
laser variables measurement; light interferometry; optical modulation; semiconductor junction lasers; spectral line breadth; FM response; fringe visibility; interferometer; intrinsic lineshape; optical modulation; semiconductor lasers; sidebands; stochastic phase fluctuations; visibility function;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860063
