Title :
IDDQ detectability of bridges in CMOS sequential circuits
Author :
Rodriguez-Montanes, R. ; Figueras, Jaume
Author_Institution :
Dept. d´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona
fDate :
1/6/1994 12:00:00 AM
Abstract :
Differences between controllability conditions for IDDQ detectability in CMOS combinational and sequential circuits in the presence of bridging defects are presented. The usual detectability condition for current testability of bridges in combinational circuits is shown to fail for defective sequential circuits. New conditions for sequential circuits are presented
Keywords :
CMOS integrated circuits; controllability; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; CMOS sequential circuits; IDDQ detectability; bridging defects; controllability conditions; current testability; defective sequential circuits; detectability condition; logic IC testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940017
