Title :
Localization and characterization of sub-surface particles in magnetic tape
Author :
Staals, A.A. ; Van Houwelingen, M.C. ; Huisman, H.F. ; Mulder, C. A M
Author_Institution :
PD Magnetics B.V., Molenstraat, Oosterhout, The Netherlands
fDate :
1/1/1987 12:00:00 AM
Abstract :
The scanning transmission electron microscope (STEM), with backscattered and secundary electron detectors, can be used as a tool for characterization and localization of small particles (<1 μm) at the surface and in the coating of magnetic tapes. The combination of energy dispersive X-ray microanalysis with STEM provides information about the chemical composition of the particles of interest.
Keywords :
Coatings; Magnetic tape recording; Magnetomechanics; Scanning electron microscopy; Coatings; Magnetic force microscopy; Magnetic properties; Probes; Scanning electron microscopy; Surface topography; Transmission electron microscopy; X-ray detection; X-ray detectors; X-ray scattering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1064770
