Title :
Transistor noise at low temperatures
Author :
Bruncke, W.C. ; Chenette, E.R. ; van der Ziel, A.
Author_Institution :
University of Minnesota, Minneapolis, Minn.
fDate :
2/1/1964 12:00:00 AM
Abstract :
It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kaminsky can be accounted for by the fact that this process was ignored.
Keywords :
Diodes; Electrical resistance measurement; Frequency measurement; Impedance; Integrated circuit noise; Low-frequency noise; Noise generators; Noise measurement; Spontaneous emission; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15282
