Title :
Temperature-dependent properties of niobium nitride Josephson tunnel junctions
Author :
Shoji, A. ; Aoyagi, M. ; Kosaka, S. ; Shinoki, F.
Author_Institution :
Electrotechnical Laboratory, Ibaraki, Japan
fDate :
3/1/1987 12:00:00 AM
Abstract :
We report the electrical properties of all niobium nitride(NbN) Josephson tunnel junctions with magnesium oxide(MgO) films as barriers in the temperature range 4.2-15 K. NbN/MgO/NbN Josephson tunnel junctions have large gap voltages(Vg=4.8-5.4 mV), large products of the maximum critical currents and the normal tunneling resistances(IcRn=3.15-3.35 mV), and small subgap leakage currents(Vm=13-138 mV) at 4.2 K. The junction parameters decreased with increase in temperature, but reasonably large junction parameters(for example, Vg=4.9 mV, IcRn=2.67 mV, and Vm=22 mV) have been obtained even at 9 K. The magnetic penetration depth in NbN electrodes has been measured up to 15 K using two-junction interferometers which consist of NbN/MgO/NbN junctions, NbN ground planes, and NbN control lines.
Keywords :
Josephson radiation in superconductor/insulator superlattices; Critical current; Current measurement; Electric variables measurement; Electrodes; Leakage current; Magnesium; Magnetic properties; Magnetic tunneling; Niobium compounds; Temperature distribution;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1064829