• DocumentCode
    1022567
  • Title

    RF surface resistance of Nb3Sn, NbZr, and NbN thin films

  • Author

    Allen, L.H. ; Beasley, M.R. ; Hammond, R.H. ; Turneaure, J.P.

  • Author_Institution
    Stanford University, Stanford, CA
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1405
  • Lastpage
    1408
  • Abstract
    The surface resistance of Nb3Sn films prepared by electron-beam co-deposition and magnetron sputtering has been measured at 8.6 GHz and from 1.5 K through Tc. We find that carefully controlled deposition temperatures of ≈900 C are necessary to obtain the lowest-loss materials. In both evaporated and sputtered samples with stoichiometric composition (Tc= 17.8 K), we see sharp transitions. In off-stoichiometric samples, however, the transition is lower and wider, yielding excessive losses. The residual losses, normal-state surface resistance, and the reduced gap values we obtain for our Nb3Sn samples are also discussed. The surface resistance of a NbZr alloy film and a NbN sample obtained from Hypres, Inc. are also reported.
  • Keywords
    Resistance measurements; Superconducting films; Surfaces; Electrical resistance measurement; Niobium; Niobium-tin; Radio frequency; Substrates; Superconducting films; Superconductivity; Surface resistance; Temperature; Tin;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1064870
  • Filename
    1064870